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CROPPED INGOT INSPECTION SYSTEM INGOT & GLASS BONDING SYSTEM WAFER SPLITTER
 
DEMOUNT &PRE-CLEANING SYSTEM FINAL-CLEANING SYSTEM
 
WAFER INSPECTION & SORTING SYSTEM AUTO PACKING SYSTEM

Cropped Ingot Inspection System
Fully automatic vision inspection system for PV ingot
High productivity : 40 ingot / hour (cycle time 90 sec.)
Precise inspection & measurement by high performance
vision camera
No drop, no damage & no tilting of ingot with the world best
handler technology
User friendly & easy to use graphical interface with
touch screen LCD monitor
Multiple ingot stock & handling mechanism
Inspection Item & Specification
Inspection item : ingot terminal dimension
Optional inspection items : ingot crack, chip-out
Camera : 4 Mega pixel high resolution camera
Lens : telecentric high performance lens

 
   
* This product of HANMI Semiconductor is protected by the property right of industry.